Electron Microscopy

The Electron Microscopy Core Facility is a part of the Innovative Electron Microscopy Department, which provides expert support, user training, and access to state-of-the-art electron microscopy instrumentation for INM researchers. The facility houses a range of scanning and transmission electron microscopes, which enables advanced structural and chemical characterization of diverse sample types, from hard materials to soft hydrogels and across multiple length scales, from the micrometre level down to atomic resolution. The facility offers regular user training, technical expertise, and comprehensive support throughout research projects. Its services are available not only to researchers within INM, but also to research groups at Saarland University, other institutions on campus, and external industrial partners.

Dr. Iurii Ivanov

Leiter Elektronenmikroskopie

Phone: +49 (0)681-9300-144

E-mail: iurii.ivanov@leibniz-inm.de

More information

Core Technologies and Methods

Scanning Electron Microscopy (SEM)

High vacuum and low-vacuum SEM analysis,

environmental SEM,

Energy Dispersive X-ray analysis (EDX)

Focused Ion beam (FIB-SEM)

Ion beam induced sputtering and deposition, TEM lamella preparation, cross-sectional milling, Serial sectioning (3D tomography)

(Scanning) Transmission Electron Microscopy ((S)TEM)

Bright and dark field TEM,

Selected area electron diffraction (SAED),

Scanning transmission electron microscopy

Energy dispersive X-ray analysis,

Electron Energy Loss spectroscopy

Instruments

FEI Quanta 250 Scanning Electron Microscope

TF (FEI) Quanta 250 is versatile FEG SEM designed for high-performance imaging and routine analysis in materials science, biology, polymers, metals, ceramics, and nanotechnology.

HT 500 eV to 30 keV
High Vacuum (HV), Low Vacuum (LV) and Environmental SEM (ESEM) modes
Cold and hot stages
Retractable multi-segmented STEM detector

FEI Versa 3D Dual Beam

TF (FEI) Versa 3D is a Dual Beam microscope combining a field emission SEM and an advanced Focused Ion Beam (FIB) used for high-resolution imaging, micromachining, sample preparation, and 3D characterization of materials.

HT 500 eV to 30 keV
High Vacuum (HV) and Low Vacuum (LV) modes
Gas Injection System (Pt)
Ga⁺ FIB current 1.5 pA to 65 nA
Build-in micromanipulator Omniprobe
EDX detector and EBSD detector

JEM-2100 Transmission electron microscope

JEM-2100 is a multipurpose Transmission Electron Microscope (TEM) manufactured by JEOL, widely used for materials science, nanotechnology, and biological research.

HT 80 kV and 200 kV
CCD camera
BF and DF STEM detectors
Motorised ThermoFisher EDX detector
Gatan image filter for EEL spectroscopy

RMC PowerTome ultramicrotome

RMC PowerTome is an ultramicrotome used to cut extremely thin sections of a specimen, typically 20-150 nm thick, for examination by transmission electron microscopy (TEM). Cryo-ultramicrotomy option allows sectioning at cryogenic temperatures (typically between about -50 °C and -180 °C, depending on the material and application).