Prof. Dr. Roland Bennewitz, INM – Leibniz-Institut für Neue Materialien gGmbH

Prof. Dr. Roland Bennewitz

Head of Interactive Surfaces
Phone: +49 (0)681-9300-213

Publications

2013
Structure vs chemistry: friction and wear of Pt-based metallic surfaces

Caron, Arnaud | Louzguine-Luzguin, Dmitri V. | Bennewitz, Roland

ACS Applied Materials & Interfaces , 2013, 5 (21), 11341-11347.
http://pubs.acs.org/doi/abs/10.1021/am403564a

Reconstruction of surface potential from Kelvin probe force microscopy images

Cohen, Gilad | Halpern, Eliezer | Nanayakkara, Sanjini U. | Luther, Joseph M. | Held, Christian | Bennewitz, Roland | Boag, Amir | Rosenwaks, Yossi

Nanotechnology , 2013, 24 (29), 295702.
http://stacks.iop.org/0957-4484/24/i=29/a=295702

Surface structures and frictional properties of Au(100) in an electrochemical environment

Hausen, Florian | Zimmet, Johannes A. | Bennewitz, Roland

Surface Science , 2013, 607 (1), 20-24.
http://dx.doi.org/10.1016/j.susc.2012.08.009

Impact of van der Waals interactions on single asperity friction

Lessel, Matthias | Loskill, Peter | Hausen, Florian | Gosvami, Nitya Nand | Bennewitz, Roland | Jacobs, Karin

Physical Review Letters , 2013, 111 (3), 035502.
http://link.aps.org/doi/10.1103/PhysRevLett.111.035502

Friction and atomic-layer-scale wear of graphitic lubricants on SiC(0001) in dry sliding

Wählisch, Felix | Hoth, Judith | Held, Christian | Seyller, Thomas | Bennewitz, Roland

Wear , 2013, 300 (1-2), 78-81.
http://dx.doi.org/10.1016/j.wear.2013.01.108

2012
Discharge during detachment of micro-structured PDMS sheds light on the role of electrostatics in adhesion

Brörmann, Katrin | Burger, Karin | Jagota, Anand | Bennewitz, Roland

Journal of Adhesion , 2012, 88 (7), 589-607.
http://dx.doi.org/10.1080/00218464.2012.682897

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Temporal development of indentation plasticity on the atomic scale revealed by force microscopy

Egberts, Philip | Gralla, Robert | Bennewitz, Roland

Physical Review B , 2012, 86 (3), 035446.
http://dx.doi.org/10.1103/PhysRevB.86.035446

Quantitative multichannel NC-AFM data analysis of graphene growth on SiC(0001)

Held, Christian | Seyller, Thomas | Bennewitz, Roland

Beilstein Journal of Nanotechnology , 2012, 3 179-185.
http://dx.doi.org/10.3762/bjnano.3.19

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Stochastic noise in atomic force microscopy

Labuda, Aleksander | Lysy, Martin | Paul, William | Miyahara, Yoichi | Grütter, Peter | Bennewitz, Roland | Sutton, Mark

Physical Review E , 2012, 86 (3), 031104.
http://dx.doi.org/10.1103/PhysRevE.86.031104

Friction and wear on single-layer epitaxial graphene in multi-asperity contacts

Marchetto, Diego | Held, Christian | Hausen, Florian | Wählisch, Felix | Dienwiebel, Martin | Bennewitz, Roland

Tribology Letters , 2012, 48 (1), 77-82.
http://dx.doi.org/10.1007/s11249-012-9945-4

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