Physical Analytics

The service group physical analytics covers electron optical and X-ray analytical investigations for all research departements of INM, research groups of the Saarland University of Saarland and external partners. For nanoscale microscopic investigations, transmission electron (TEM) and scanning electron microscopy (SEM) coupled with X-ray spectral analysis is used. TEM lamellae of a wide variety of samples are prepared inside with a focused ion beam (FIB) microscope and further thinned by focussed Argon ion beam (Nanomill) for atomic analytical analysis. Other preparation techniques such as microtomy, electrolytical polishing, ion milling with non-focusing ion beam and sputter coating are also available.


Dr. Koch, Marcus
Phone: +49 (0)681-9300-144