The service group physical analytics covers electron optical and X-ray analytical investigations for all research departements of INM, research groups of the Saarland University of Saarland and external partners. Phase, texture and stress analysis can be performed by X-ray diffraction, crystal size and strain in particular are determined by peak shape analysis. Crystallographic phase changes can be monitored in-situ by the use of a heating chamber. For nanoscale microscopic investigations, transmission electron (TEM) and scanning electron microscopy (SEM) coupled with X-ray spectral analysis is used. TEM lamellae of a wide variety of samples are prepared inside with a focused ion beam (FIB) microscope and further thinned by focussed Argon ion beam (Nanomill) for atomic analytical analysis. Other preparation techniques such as microtomy, electrolytical polishing, ion milling with non-focusing ion beam and sputter coating are also available.