Professor Niels de Jonge was honored by the Microscopy Society of America
For his publication “The influence of beam broadening on the spatial resolution of Annular dark field scanning transmission electron microscopy” he received the Best Software and Instrumentation Paper Award.
The physicist is head of the program division Innovative Electron Microscopy at the INM, and holds an honorary professorship for physics at Saarland University. Electron microscopy is commonly used to examine ultra thin samples but many relevant samples have micrometers thickness. In his publication de Jonge describes how the electron beam can be optimized in dark-field scanning transmission electron microscopy for the investigation of thick samples, and how the resolution changes as function of the vertical position of the microscope’s focus in the sample.