CISCEM 2016 – Conference on In-situ and Correlative Electron Microscopy
From October 11-12, 2016, the 3rd International Conference on In-situ and Correlative Electron Microscopy (CISCEM 2016) will take place in Saarbrücken.
It aims to bring together an interdisciplinary group of scientists from the fields of biology, materials science, geology, chemistry, and physics, to discuss future directions of in-situ electron microscopy research. Topics will include nanoscale studies of biological samples, and functional materials under realistic or near realistic conditions, for example, in gaseous environments, at elevated temperatures, and in liquid.
It will be discussed how dynamical processes can be studied by including the time domain in electron microscopy, while taking into account the electron beam effects. CISCEM 2016 is also open to other in-situ techniques, such as X-ray, near field or scanning probe microscopy, with the view to stimulate fruitful discussions on multi-scale and correlative approaches.